Oct. 20, 2015

Park Systems, world leader in Atomic Force Microscopes is partnering with the prestigious Stanford Nano Shared Facilities (SNSF), a highly advanced Nanotechnology multi disciplinary research facility, to provide a free workshop and live demo on Nov 10, 2015. The workshop topics are Park Systems AFM automatizing software using Self Optimizing Scan Control and Park Scanning Ion Conductance Microscopy (SICM) Technology and Its Applications. Park will also unveil the Park NX10 SICM module that enables innovative electrochemistry studies. This workshop is open to all interested in this topic and includes lunch.
"Park Systems NX10 is the major nano scientific instrument and atomic force microscope used at our Nano Shared Facility and it is an honor to have founder Dr. Sang-il Park, return to his alma mater and present at the seminar," states Tobi Beetz, PhD Associate Director, Stanford Nano Shared Facilities. "We encourage all researchers to attend this event and to utilize the state-of-the- art Park Atomic Force Microscope equipment that we have available."

Dr. Sang-il Park, distinguished Stanford Alumni and founder of Park Systems will present on Park's continuous innovations in atomic force microscopy including the revolutionary advancement, SmartScan that automatizes the imaging function using AFM just like today's point-and-click digital cameras. Park Systems advanced SmartScan is a pioneering AFM intelligence that produces high quality imaging with a single click. SmartScan's unique design opens up the power of AFM nanoscopic tools to everyone and drastically boosts the productivity of all users.
"Park Systems unprecedented upgrades in AFM equipment over the years provide capabilities never before available that advance the ease at which we are able to examine nanoscale particles in various states," states Dr. Sang-il Park, Park Systems Chairman and CEO. "Our goal is to provide researchers with reliable and repeatable high resolution imaging of nanoscale cell structures in any environment by offering a platform of advanced easy-to-use nanoscale AFM and SICM tools."

The complimentary half day seminar titled, "The Latest Advances in Atomic Force Microscopy" on Nov. 10 at the Stanford Nano Shared Facility includes a complimentary lunch and is open to all interested in learning more about AFM. It will be extremely beneficial to researchers interested in nanoscale imaging, materials property investigation, bio sciences, semiconductor analysis, as well as biochemistry researchers (hydrogel, nanopore membrane, electrochemistry) and electrochemistry researchers. The seminar will include a live demonstration of Park NX-10 and discussion of Automatizing AFM using Self Optimizing Scan Control and use of Scanning Ion Conductance Microscopy on Park NX10 AFM Systems.

Image: Park Systems NX 10 Atomic Force Microscope.