Nov. 17, 2015

FEI (NASDAQ: FEIC) and ICON Analytical will hold workshops and demonstrations of FEI’s Talos™ scanning transmission electron microscope (STEM) at the Indian Institute of Science, Materials Research Centre in Bangalore, starting 23 November through 15 December 2015. The industry-leading Talos F200X STEM delivers high-resolution characterization data in two- and three-dimensions. Innovative integration of multiple imaging and analytical modes increases throughput and repeatability without compromising data quality. With Talos, scientists and engineers can acquire statistically meaningful sub-nm data across all research labs in industry, government and academia.
“Talos is a new-generation TEM designed for multi-disciplined laboratories. Our customers will appreciate that new, advanced characterization data can be acquired rapidly and more easily with a lower level of expertise than is typical. Talos can improve productivity by providing sub-nm data to more users in less time, while also reducing training overhead,” states Anand Rao, managing director at ICON Analytical, India