April 21st, 2015

“AFM nanomechanical characterization unfortunately does not have a ‘one-size-fits-all’ solution,” said Dr. Hurley. “The various techniques each offer unique advantages and cover some portion of the total range of properties that researchers need to explore. The tools that comprise the NanomechPro Toolkit both span this range and together provide complementary information.”

Dr. Marta Kocun, Asylum Research post-doctoral researcher, added, “I’ve enjoyed a unique opportunity to push these nanomechanical techniques to their limits and help improve them. I find myself always reaching for different tools in the NanomechPro toolkit depending on the specifics of my sample and what I’m trying to learn about it. I could never go back to when I was restricted to just phase imaging and force mapping.”

As described in the application note, the NanomechPro Toolkit consists of both standard imaging modes that are included with every Asylum Research AFM as well as several optional techniques. The standard modes include force curves and force volume mapping, phase imaging, Bimodal Dual AC Imaging, and Loss Tangent Imaging. The optional modes include Fast Force Mapping Mode, instrumented vertical nanoindentation, force modulation imaging, AM-FM Viscoelastic Mapping Mode, and Contact Resonance Viscoelastic Mapping Mode.