May 14th, 2015
The FMS-EM is a compact force readout tool that allows tensile measurements to be made inside an SEM/FIB. Whilst existing devices for mechanical testing have either the necessary spatial or force resolution, they rarely have both. It overcomes these limitations by using a highly sensitive piezoresistive AFM tip attached to a MM3A-EM micromanipulator. The force measurement tip can be positioned and oriented with high precision at the exact area of interest on the structure to be measured. Force feedback is displayed on the controller and is coupled with a loudspeaker to enable the user to intuitively characterize materials and micromechanical structures by their resonance frequencies. The sharp silicon tips also allow the FMS-EM to be used for nanoindentation experiments in a wide variety of materials. The system offers a complete force measurement solution including software for data acquisition, visualisation and export.
Kleindiek Nanotechnik will attend mmc2015, stand #605. On Tuesday 30th June at 12:30, they will be giving a workshop on Micromanipulation in Microscopy: handling and characterising nanostructures. This is free to attend for attendees of this year's premier UK microscopy event. Visitors are invited to attend the workshop or just come along to meet representatives from Kleindiek and EM Resolutions to see the exciting range of micromanipulators and nanotools.